Focused Ion Beam Application, Nanofabrication, Expert Consultant Resume

• Electron
• Ion
• Photon Beam and Nanofabrication
• Electrical and Computer Engineering
• Research in Electronics and Applied Physics
• Nano Engineering
• Micro System Technology

This experts holds a Ph.D., a M.S., and a B.S. in Physics from the Carnegie - Mellon University.

Focused Ion Beam Application, Nanofabrication, Expert Consultant Resume

This expert specializes in electrical and computer engineering. This consultant has experience in the research in electronics and applied physics. Additional specialization of this expert includes focused ion beam (FIB) fabrication, topdown nanofabrication, RFID tags, and surface acoustic wave grating devices including filter banks, and pulse compressors.

This consultant's principal research has been directed at the development of focused ion beam applications and in understanding the nature of intense focused ion beam interactions with surfaces. Focused ion beams are routinely used in integrated circuit manufacturing for fault diagnosis and for circuit rewiring. As one of the first to recognize the circuit editing potential, this consultant worked to demonstrate and develop the process, and demonstrated focused ion beam induced deposition of gold, platinum, and copper. This expert has also demonstrated the unique capabilities of focused ion beam implantation to make special semiconductor devices, such as a tunable Gunn diode, faster CCD, and superior performance MOSFET's.

Much of this consultant's research is closely related to the general field of top-down nanofabrication. This consultant has attended the conference on Electron, Ion, and Photon Beam and Nanofabrication (EIPBN). This consultant has used many of the technologies in this field including optical and e-beam lithography, reactive ion etching, electron beam evaporation, scanning electron microscopy, and Rf sputtering.

This consultant has collaborated in using RF ID tags for military inventory and for homeland security applications, and has developed a means of writing the identity in RFID tags using focused ion beams.

In addition, this consultant worked on the development of surface acoustic wave grating devices including filter banks, and pulse compressors.

Consultant, Kevin Kennedy Associates Inc.

Professor, ECE Dept., major university

Principal Research Scientist, Senior Research Scientist, Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, MIT

Staff Member, MIT Lincoln Laboratory

Staff Member, Centre-National de la Recherche Scientifique, Paris, France

NSF Postdoctoral Fellow, Max Planck Institute, Stuttgart, Germany

Focused Ion And Electron Multi Nanobeams, A Radically New Technology